August 2, 2004

Germany's Ernst Ruska Center and FEI Join in Partnership Program

 The Center's development project with FEI will advance sub-atomic resolution
           electron microscopy for analyzing atoms and their bonds

HILLSBORO, Ore., Aug. 2 /PRNewswire-FirstCall/ -- FEI Company (Nasdaq: FEIC) announced today that Germany's leading national center for Microscopy and Spectroscopy with Electrons -- the Ernst Ruska Center -- has selected FEI Company as a partner for developing the next era of analytical microscopy. A 300kV Scanning/transmission electron microscope (S/TEM) purchased by the Ernst Ruska Center will deliver integrated capabilities for imaging and chemical analysis of matter with ultimate resolutions crossing the 1-Angstrom barrier. One Angstrom is one-tenth of a nanometer, approximately one-third the size of a carbon atom, and is a key dimension for atomic level research.

This ultra-high resolution S/TEM system and developed applications will open doors for researchers to study morphology, crystallography, elemental and chemical composition, as well as electronic structure at resolution levels not demonstrated before in a single advanced instrument. Moreover, with the ability to look between atoms, researchers will be able to study the chemical nature of atoms and what holds them together. This advanced S/TEM features a proprietary FEI platform for aberration corrected microscopy and advanced optics. Its design meets the stringent demand of ultra high stability to allow resolutions well below 1 Angstrom, for transmission and scanning probe operation (STEM), in one system. The microscope can be operated up to 300kV for ultimate brightness, current and resolution, delivering the best imaging and analysis performance available.

"It is our mission to provide German users with cutting-edge equipment in atomic resolution electron microscopy and spectroscopy which, due to the advent of aberration-corrector technology, has become one of the most innovative fields of analytical instrumentation," commented Professor Dr. Knut Urban, the president of the German physical society and co-director of the recently established Ernst Ruska Center. "FEI has proven to be an international key player in this area. The partnership with FEI will allow us to stay at the forefront of instrumental development."

Professor Dr. Joachim Mayer, co-director of the Center added: "Electron Microscopy is making a quantum leap towards an experimental technique in which the information on an atomic object is no longer limited by the optical qualities of the instrument. Physicists and materials scientists worldwide are looking forward to carrying out high-precision measurements on properties of atomic structures urgently needed in nanosciences. FEI technology will allow the Ernst Ruska Center's users to exploit these fascinating possibilities."

"We are proud to be selected by Germany's leading center for ultra-high resolution analytical microscopy," said Vahe' Sarkissian, FEI's chairman, president and chief executive officer. "FEI remains the world leader in high resolution imaging and analysis and an important enabler for the world's growing nanotechnology applications. In every market we serve, we are delivering the tools needed to research and develop new nanoscale products and devices. We believe that this relationship will result in important breakthroughs for advanced microscopy."

In March of this year, FEI announced the first-ever sub-Angstrom resolution obtained on a commercially available 200 kV TEM. Recognizing the scientific demand for aberration corrected TEM/STEM applications, FEI has developed an advanced TEM/STEM 300 kV system that achieves sub-angstrom resolution without the aid of correctors or a monochromator. Going forward, this new system will also be available with aberration correctors and a monochromator. The addition of these technologies on such an advanced platform will bring nanoscience into routine sub-angstrom research, providing researchers and manufacturers greater access to the sub-nanoscale.

About FEI

FEI's Tools for Nanotechâ„¢, featuring focused ion- and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the level. With R&D centers in North America and Europe, and sales and service operations in more the 40 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of the this century into reality. More information can be found on the FEI website at: www.feicompany.com

About Ernst Ruska Center (ER-C)

The ER-C for Microscopy and Spectroscopy with Electrons is jointly operated by the Research Center Juelich and the Technical University of Aachen, under the auspices of the German Science Foundation and the joint directorship of Professors Knut Urban and Joachim Mayer. The Center unites two groups, at Aachen and Juelich, with the largest instrumental and personnel resources in the field of electron microscopy in Germany. Operated as a user facility, the Center provides German universities, research laboratories and industry with the most advanced high-resolution and analytical electron microscopy using monochromators, analytical energy filters and aberration corrector elements. The main fields of activity comprehend the analysis of nanostructured ceramics, metals, semiconductors and oxide superconductors together with lattice defects. For more information visit: www.er-c.org.

SOURCE  FEI Company
    -0-                             08/02/2004
    /CONTACT:  Cathy van Mastrigt, Marketing Communications of FEI Company,
Europe, +31 40 276.6225 or cathy.van.mastrigt@feico.com; or Dan Zenka, APR,
Corporate Communications of FEI Company, North America, +1-503-726-2695 or
dzenka@feico.com/
    /Web site:  http://www.feicompany.com /
    (FEIC)


CO: FEI Company; ER-C for Microscopy and Spectroscopy with Electrons; Research Center Juelich; Technical University of Aachen; Ernst Ruska Center ST: Oregon, Germany IN: CPR SU: JVN

HD -- SFM063 -- 0260 08/02/2004 11:35 EDT http://www.prnewswire.com


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