MAPS provides an easy-to-use workflow to import and correlate an image from any type or brand light microscope with the ultrastructure obtained from an FEI scanning electron microscope (SEM) or DualBeam™ (focused ion beam/SEM) system. Researchers can then quickly navigate to a region of interest identified in the light image, bringing to bear the full resolving power of the electron microscope to reveal ultrastructural detail. MAPS also enables the assembly of high-resolution, large-field images by automatically acquiring a grid of smaller electron microscope image tiles and stitching them together in a composite image that can reveal large scale relationships and organization, while still preserving full resolution detail throughout.
"The functionality and automation within MAPS is new to the industry," noted
"In addition to the life sciences, we see potential benefits of MAPS in others industries, such as oil & gas, mining, electronics and materials science," said Hubert.
The MAPS software is available now for current
FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). Headquartered in
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This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the MAPS solution. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the
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