All Releases
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FEI Company Reports Sequential Increase in Revenue and Operating Income
04/29/08
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HILLSBORO, Ore., Apr 29, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) reported first-quarter revenue and operating income that were above the levels of the fourth quarter of 2007. Revenues were at record levels for the fourth time in the last five quarters.
Net sales for the quarter ended March 30, 2008 of $151.6 million were up 1% compare...
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FEI Company Announces Date for First Quarter Financial Release
04/16/08
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HILLSBORO, Ore., Apr 16, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) will release its financial results for the first quarter of 2008 after the financial markets close on Tuesday, April 29, 2008. The first quarter ended on March 30, 2008.
A conference call and simultaneous webcast to discuss the results will be held on Tuesday, April 29, ...
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FEI and Imago Scientific Instruments Announce Collaboration
04/14/08
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HILLSBORO, Ore. & MADISON, Wis., Apr 14, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq: FEIC) and Imago Scientific Instruments today announced a comprehensive collaboration on the distribution and marketing of Imago's LEAP(TM) product line. The arrangements allow for FEI to establish an equity position in Imago and the option to purchase Imago in the...
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FEI Company Proxy Materials Now Available on the Internet
04/04/08
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HILLSBORO, Ore., Apr 04, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) announced the Internet availability of proxy materials for its 2007 Annual Meeting of Shareholders under the U.S. Securities and Exchange Commission's Notice and Access rule. FEI's proxy materials can now be found at http://investor.fei.com/annual_proxy.cfm. In adopting the ...
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FEI Receives Award for Titan S/TEM at Nano Tech 2008 in Japan
03/19/08
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PORTLAND, Ore., Mar 19, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq: FEIC) today announced that its Titan(TM) 80-300 S/TEM (scanning/transmission electron microscope), the world's most powerful commercially available microscope, was honored with the award for technical excellence in evaluation and measurement at Nano Tech 2008, February 13-15 in To...
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FEI and Malvern Release Advanced Particle Characterization System
03/03/08
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PORTLAND, Ore., Mar 03, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd. (Malvern, UK) have released Quanta Morphologi, a powerful new solution combining the performance of FEI's Quanta FEG scanning electron microscope and Malvern's proven Morphologi particle characterization software. For the first time ever, Quanta ...
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FEI Company Finalizes Financial Statements and Files Form 10-K
02/29/08
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HILLSBORO, Ore., Feb 29, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq:FEIC) filed its Annual Report on Form 10-K with the U.S. Securities and Exchange Commission today.
The Form 10-K reports that the company's annual revenue for 2007 was $592.5 million and its fourth quarter revenue was $150.2 million. Both totals are $2.3 million lower than the...
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FEI Company to Present at Investor Conference
02/20/08
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HILLSBORO, Ore., Feb 20, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) announced that its management will make a presentation at the D.A. Davidson Electronic Systems Design Conference on February 21, 2008 at 2:45 p.m. MST. The conference will be held at the Ritz Carlton Hotel in Denver, Colorado.
Interested investors will be able to access ...
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FEI Company Reports Fourth-Quarter Financial Results
02/04/08
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HILLSBORO, Ore., Feb 04, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) reported 2007 annual revenue that was 24% higher and net income that was nearly three times greater than in 2006. Fourth quarter revenue grew both sequentially and year-over-year, as did quarterly net income, which was aided in the latest quarter by a tax benefit.
Net sa...
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FEI Introduces Titan Krios(TM) TEM for Structural Biology
02/04/08
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PORTLAND, Ore., Feb 04, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq:FEIC) has introduced a revolutionary, high-throughput, cryo transmission electron microscope (TEM) that combines high- throughput sample handling with state-of- the-art electron optics. It provides fast, fully-automated three-dimensional data about biological molecules and macromol...
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FEI Company Announces Dates for Investor Presentation and Fourth Quarter Financial Release
01/25/08
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HILLSBORO, Ore., Jan 25, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq:FEIC) will release its financial results for the fourth quarter of 2007 after the financial markets close on Monday, February 4, 2008. The fourth quarter ended on December 31, 2007. A conference call and simultaneous webcast to discuss the results will be held on Monday, February ...
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FEI Opens China NanoPort
01/18/08
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HILLSBORO, Ore., Jan 18, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq: FEIC) today opened a NanoPort in Shanghai, China. FEI NanoPorts are centers of technical and applications excellence where FEI customers and partners can collaborate with FEI specialists on the ongoing development of new ideas and innovative solutions for advancing nanoscale tech...
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FEI Company to Present at Investor Conference
01/04/08
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HILLSBORO, Ore., Jan 04, 2008 (BUSINESS WIRE) -- FEI Company (Nasdaq:FEIC) announced that its management will make a presentation at the Tenth Annual Needham Growth Stock Conference on January 8, 2008 at 3:30 p.m. EST. The conference will be held at the New York Palace Hotel in New York City.
Interested investors will be able to access an audio...
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FEI Company to Redeem Its 5.5% Convertible Subordinated Notes
01/03/08
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HILLSBORO, Ore., Jan 03, 2008 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) has called for the redemption on January 24, 2008, of its 5.50% Convertible Subordinated Notes due August 15, 2008 (the "Notes"). There is approximately $45.9 million aggregate principal amount of the Notes outstanding.
Prior to 5:00 p.m., New York City time, on January ...
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FEI Announces Joint Research Program with the FOM Foundation
12/18/07
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HILLSBORO, Ore., Dec 18, 2007 (BUSINESS WIRE) -- FEI Company (Nasdaq:FEIC) and the Netherlands-based FOM foundation have announced a joint nanotechnology research project. The goal of the Industrial Partnership Program (IPP) is to advance electron microscopes and focused ion beam systems (FIBs) so that the structure of materials can be made visible...
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Inner Space Exploration Comes to Philadelphia's Central High With Gift of a Phenom(TM) Microscope From FEI
11/19/07
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PHILADELPHIA, Nov 19, 2007 (BUSINESS WIRE) -- Blast off for inner space. Philadelphia's Central High became the first high school in the nation to open deep inner space exploration to students with the arrival of a new Phenom(TM) table top scanning electron microscope. Providing magnification up to 20,000x with 30 nm resolution, the instrument is d...
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FEI Company to Present at Investor Conference
11/16/07
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HILLSBORO, Ore., Nov 16, 2007 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) announced that its management will make a presentation at the Credit Suisse Technology Conference on November 28, 2007, at 3:30 p.m. MST. The conference will be held at the Phoenician Hotel in Scottsdale, AZ.
Interested investors will be able to access an audio webcast o...
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First FEI Titan(TM) S/TEM Installed in Sweden
11/15/07
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HILLSBORO, Ore., Nov 15, 2007 (BUSINESS WIRE) -- Chalmers University of Technology in Goteborg, Sweden is the first institute in that country to have installed an FEI (Nasdaq:FEIC) Titan(TM) scanning/transmission election microscope (S/TEM), the world's most powerful commercially-available microscope. The university's inauguration of the advance in...
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FEI Announces Upcoming Webinars
11/07/07
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HILLSBORO, Ore., Nov 07, 2007 (BUSINESS WIRE) -- FEI Company (NASDAQ:FEIC) is sponsoring two upcoming webinars. Focusing on the latest solutions and techniques for advanced semiconductor and solar energy development and manufacturing, the webinars are being provided without charge as a service of FEI.
Tuesday, November 13, 2007, 12 p.m. Central...
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FEI Introduces V600CE Upgrade for Backside Edit
11/05/07
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HILLSBORO, Ore., Nov 05, 2007 (BUSINESS WIRE) -- FEI (Nasdaq:FEIC) today announced a field upgradeable option to add backside circuit edit capabilities to its recently announced V600CE focused ion beam (FIB) system. The available enhancement adds an infra-red camera and bulk silicon trenching capabilities to the highly accurate and automated FIB pl...
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