News Releases

All Releases
View Summary Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center
Sep 8, 2008
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View Summary FEI's New MLA 600F High Speed Automated Mineralogy Analyzer Enables Rapid Optimization of Mineral Processing Operations
Sep 3, 2008
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View Summary FEI's New X-FEG Electron Source Further Extends Lead in Scanning/Transmission Electron Microscope Imaging and Analysis
Sep 1, 2008
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View Summary FEI Company Announces Webcast of Oregon Technology Investors Tour Meeting on August 12
Aug 11, 2008
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View Summary FEI and Max Planck Institute of Biochemistry Collaborate on Correlative Microscopy
Aug 4, 2008
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View Summary FEI and Icon Analytical Selected to Develop India's Premier Imaging Facility: The International Centre for Material Science (ICMS)
Jul 29, 2008
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View Summary FEI Company Reports Second Quarter Financial Results
Jul 29, 2008
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View Summary FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
Jul 15, 2008
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View Summary FEI Company Announces Dates for Second Quarter Financial Release and Investor Conference Participation
Jul 10, 2008
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View Summary FEI Introduces New Category of Extreme High Resolution Scanning Electron Microscopy
Jul 7, 2008
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View Summary FEI Announces New Titan ETEM for Energy, Environmental and Chemical Research
Jun 23, 2008
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View Summary FEI Company Announces Webcast of New York Investor Meeting on June 23
Jun 17, 2008
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View Summary FEI Company Announces Plans to Repay Convertible Debt and Enters New Revolving Credit Agreement
Jun 10, 2008
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View Summary FEI and Shimadzu Corporation Announce Sales Agreement in Japan
Jun 2, 2008
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View Summary FEI Company Reports Sequential Increase in Revenue and Operating Income
Apr 29, 2008
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View Summary FEI Company Announces Date for First Quarter Financial Release
Apr 16, 2008
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View Summary FEI and Imago Scientific Instruments Announce Collaboration
Apr 14, 2008
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View Summary FEI Company Proxy Materials Now Available on the Internet
Apr 4, 2008
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View Summary FEI Receives Award for Titan S/TEM at Nano Tech 2008 in Japan
Mar 19, 2008
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View Summary FEI and Malvern Release Advanced Particle Characterization System
Mar 3, 2008
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Stock Information

NASDAQ:FEIC
Last Price: $19.68
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Feb 8, 2010 4:00 PM ET

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